Revised Edition
Paperback (31 May 2002)
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This CD-ROM originates from the 2002 IEEE International Reliability Physics Symposium, and is concerned with electron devices. Its contents include: non volatile memory; dielectrics; hot carriers; assembly/packaging; device dielectrics; interconnects; product reliability; and device and process.
| ISBN: | 9780780373525 |
| Publisher: | I.E.E.E.Press |
| Imprint: | I.E.E.E.Press |
| Pub date: | 31 May 2002 |
| Edition: | Revised Edition |
| DEWEY: | 621.3815 |
| Language: | English |
| Number of pages: | 500 |
| Weight: | -1g |
| Height: | 279mm |
| Width: | 216mm |
$6.66off
Paperback
Published 01 Oct 1996
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