High Resolution Electron Microscopy of Defects in Materials

High Resolution Electron Microscopy of Defects in Materials Symposium Held April 16-18, 1990, San Francisco, California, U.S.A - Materials Research Society Symposium Proceedings

Hardback (10 Aug 1990)

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Publisher's Synopsis

Topics covered in this volume include point defects and aggregates, dislocations and linear defects, grain boundaries and extended planar defects, surfaces and small particles, defect-controlled phase transformations and reactions and amorphous materials.

Book information

ISBN: 9781558990722
Publisher: Materials Research Society
Imprint: Cambridge University Press
Pub date:
DEWEY: 620.11299
DEWEY edition: 20
Language: English
Number of pages: 391
Weight: 1000g
Height: 231mm
Width: 160mm
Spine width: 27mm