Hardback (27 Jan 1998)
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Integrating advances in instrumentation and methods, this work offers an approach to solving problems in surface and interface analysis, beginning with a particular problem and then explaining the most rational and efficient route to a solution. The book discusses electron optical and scanned probe microscopy, high spatial resolution imaging and synchrotron-based techniques. It emphasizes problem-solving for different classes of materials and material function.
| ISBN: | 9780824700805 |
| Publisher: | Taylor and Francis |
| Imprint: | CRC Press |
| Pub date: | 27 Jan 1998 |
| DEWEY: | 541.33 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 968 |
| Weight: | 1429g |
| Height: | 241mm |
| Width: | 165mm |
| Spine width: | 54mm |
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