Gettering and Defect Engineering in Semiconductor Technology VI

Gettering and Defect Engineering in Semiconductor Technology VI - Solid State Phenomena

Paperback (13 Jul 1995) | German

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Publisher's Synopsis

At the present time, Si-based technology is undergoing a transition to the next generation of substrates, having a diameter of 300 mm. The fundamental physical limits are being approached in terms of miniaturization, increased chip area, faster switching speeds, and diversity of operations. This raises the question of the intrinsic limits of the currently predominant semiconductor, silicon, and of those circumstances where it may be advantageous to turn to materials such as GaAs, InP, or SiC.

Book information

ISBN: 9783908450115
Publisher: Trans Tech Publications Ltd
Imprint: Trans Tech Publications
Pub date:
Language: German
Number of pages: 640
Weight: 1179g
Height: 254mm
Width: 177mm
Spine width: 38mm