Paperback (15 Jun 2006)
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Papers from a March 2003 symposium describe the latest research in deep submicron integrated circuit design and development. Some areas discussed include reliability and design in deep submicron technologies, reducing leakage currents in VLSI circuits, SoC methodology, testing of SoCs, and design considerations in advanced technology. Other topics
| ISBN: | 9780769518817 |
| Publisher: | IEEE Computer Society |
| Imprint: | IEEE Computer Society |
| Pub date: | 15 Jun 2006 |
| DEWEY: | 621.395 |
| DEWEY edition: | 22 |
| Language: | English |
| Number of pages: | 457 |
| Weight: | -1g |
| Height: | 266mm |
| Width: | 209mm |
| Spine width: | 31mm |
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