Fourth IEEE International Symposium on Electronic Design, Test and Applications : Proceedings : [Delta]'08 : 23-25 January 2008, SAR, China

Fourth IEEE International Symposium on Electronic Design, Test and Applications : Proceedings : [Delta]'08 : 23-25 January 2008, SAR, China

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Book information

ISBN: 9780769531106
Publisher: IEEE Computer Society
Imprint: IEEE Computer Society
Pub date:
DEWEY: 621.381
DEWEY edition: 22
Language: English