Field-Ion Microscopy

Field-Ion Microscopy - Defects in Crystalline Solids

Book (01 Jan 1970)

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Book information

ISBN: 9780720417524
Publisher: North-Holland Publishing Co.
Imprint: North-Holland Publishing Co.
Pub date:
DEWEY: 548.81
DEWEY edition: 18
Language: English
Number of pages: 257
Weight: -1g
Height: 230mm
Width: 150mm