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Engineering Thin Films With Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing

Engineering Thin Films With Ion Beams, Nanoscale Diagnostics, and Molecular Manufacturing 30-31 July 2001, San Diego, USA - SPIE Proceedings Series

Illustrated Edition

Book (01 Jan 2001)

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Book information

ISBN: 9780819441829
Publisher: SPIE
Imprint: SPIE
Pub date:
Edition: Illustrated Edition
DEWEY: 621.38152
DEWEY edition: 21
Language: English
Number of pages: 192
Weight: -1g

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