Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability

Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing

Softcover reprint of hardcover 1st ed. 2008

Paperback (23 Nov 2010)

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Publisher's Synopsis

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

Book information

ISBN: 9781441945136
Publisher: Springer US
Imprint: Springer
Pub date:
Edition: Softcover reprint of hardcover 1st ed. 2008
DEWEY: 620.5
DEWEY edition: 22
Language: English
Number of pages: 408
Weight: 640g
Height: 234mm
Width: 156mm
Spine width: 21mm