Eighth International Symposium on Laser Metrology

Eighth International Symposium on Laser Metrology Macro-, Micro-, and Nano-Technologies Applied in Science, Engineering, and Industry : 14-18 February, 2005, Merida, Yucatan, Mexico - Proceedings of SPIE

Paperback (30 Jul 1985)

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Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9780819457578
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.366
DEWEY edition: 22
Language: English
Number of pages: 852
Weight: 1769g
Height: 273mm
Width: 215mm
Spine width: 38mm