Publisher's Synopsis
Topics covered in this volume include reliability and degradation of electronic devices, recombination-enhanced motion and related defects, defects in epitaxial layers and reliability and degradation of metal III-V systems.
Degradation Mechanisms in III-V Compound Semiconductor Devices and Structures Symposium Held April 17-18, 1990, San Francisco, California, U.S.A - Materials Research Society Symposium Proceedings
Hardback (25 Jan 1991)
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Book information
| ISBN: | 9781558990739 |
| Publisher: | Materials Research Society |
| Imprint: | Cambridge University Press |
| Pub date: | 25 Jan 1991 |
| DEWEY: | 621.38152 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 269 |
| Weight: | 1000g |
| Height: | 231mm |
| Width: | 155mm |
| Spine width: | 25mm |
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