Paperback (31 Dec 1998)
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This volume covers topics including: yield and defect density; reliability enhancement; defect and fault analysis; testing techniques; fault diagnosis; fault-tolerant designs; high-level synthesis of reliable systems; and yield and reliability issues of analogue and mixed signal circuits.
| ISBN: | 9780818688324 |
| Publisher: | I.E.E.E.Press |
| Imprint: | I.E.E.E.Press |
| Pub date: | 31 Dec 1998 |
| DEWEY: | 621.395 |
| Language: | English |
| Number of pages: | 325 |
| Weight: | -1g |
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