Computer Image Analysis in the Study of Art

Computer Image Analysis in the Study of Art 28-29 January 2008, San Jose, California, USA - Proceedings Electronic Imaging Science and Technology

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Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9780819469823
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 702.85
DEWEY edition: 22
Weight: 476g
Height: 266mm
Width: 234mm
Spine width: 12mm