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Charged Particle Detection, Diagnostics, and Imaging

Charged Particle Detection, Diagnostics, and Imaging 30 July-2 August 2001, San Diego, USA - SPIE Proceedings Series

Book (01 Jan 2001)

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Book information

ISBN: 9780819442246
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.484
DEWEY edition: 21
Language: English
Number of pages: 236
Weight: -1g

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