Atomic-Scale Imaging of Surfaces and Interfaces

Atomic-Scale Imaging of Surfaces and Interfaces Symposium Held November 30-December 2, 1992, Boston, Massachusetts, U.S.A - Materials Research Society Symposium Proceedings

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Publisher's Synopsis

Describes the front-line technologies in the campaign to image and identify individual atoms, such as scanning tunneling, atomic force, low energy electron, and other microscopies; high and low energy, external and internal source electron holographies; and others now capable of resolving atomic features on surfaces and interfaces. The 45 papers we

Book information

ISBN: 9781558991903
Publisher: Materials Research Society
Imprint: Materials Research Society
Pub date:
DEWEY: 620.44
DEWEY edition: 20
Language: English
Number of pages: 288
Weight: 635g
Height: 241mm
Width: 165mm
Spine width: 19mm