2nd Edition
Hardback (01 Jun 1997)
Not available for sale
Includes delivery to the United States
Out of stock
Based on over 25 years of research at UMIST, this book contains over 1500 scanning electron micrographs and other pictures offering a unique collection of documentary information which provides a basis for identifying failure modes.
| ISBN: | 9781855733190 |
| Publisher: | CRC |
| Imprint: | CRC |
| Pub date: | 01 Jun 1997 |
| Edition: | 2nd Edition |
| DEWEY: | 677.02832 |
| DEWEY edition: | 21 |
| Number of pages: | 468 |
| Weight: | 1991g |
| Height: | 297mm |
| Width: | 210mm |
| Spine width: | 45mm |
