Anwendungen Der Hochauflösenden Sekundärionenmassenspektrometrie (SIMS) in Der Oberflächenanalyse
Paperback (01 Jan 1981) | German
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Book information
ISBN: | 9783531030494 |
Publisher: | Springer Nature Customer Serv. Cent. LLC |
Imprint: | Vs Verlag Fur Sozialwissenschaften |
Pub date: | 01 Jan 1981 |
Language: | German |
Number of pages: | 28 |
Weight: | 64g |
Height: | 244mm |
Width: | 170mm |
Spine width: | 2mm |