Advances in the Cyrstallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals

Advances in the Cyrstallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals - Physics and Chemistry of Materials With Low-Dimensional Structures

Hardback (31 Mar 1999)

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Publisher's Synopsis

Modulated crystals have been intensively investigated over the past several years and it is now evident that an understanding of their crystallography and microstructure is fundamental to the elucidation of the physical properties and phase transitions in these materials. This book brings together for the first time the crystallographic descriptions and experimental methods for the structural and microstructural analysis of modulated crystals as described by well-known researchers in the various areas. The emphasis is on charge density wave modulations, and the detailed analysis of the prototypical NbTe4/TaTe4 system gives practical applications of the methods. Scanning Tunnelling Microscopy is a new technique providing significant new insights into atomic scale details of the modulations' structures and a chapter on this method is included.

Book information

ISBN: 9780792356042
Publisher: Springer
Imprint: Kluwer Academic
Pub date:
DEWEY: 530.41
DEWEY edition: 21
Language: English
Number of pages: 261
Weight: 625g
Height: 230mm
Width: 177mm
Spine width: 19mm