Advanced X-ray/EUV Radiation Sources and Applications

Advanced X-ray/EUV Radiation Sources and Applications 11-13 July 1990, San Diego, California - Proceedings / SPIE-the International Society for Optical Engineering

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Book information

ISBN: 9780819404060
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 539.7222
DEWEY edition: 20
Language: English
Number of pages: 289
Weight: -1g