Hardback (26 Jan 2010)
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Written by eminent scientists, Advanced Trace Analysis, this textbook discusses plethora of topics, including using statistical approaches to verify trace element analysis data, the trace analysis techniques like ICPMS and XRF, ion beam analysis technique and the speciation analysis of uranium relevant to waste disposal and management.
| ISBN: | 9788184870299 |
| Publisher: | Alpha Science International |
| Imprint: | Narosa Publishing House |
| Pub date: | 26 Jan 2010 |
| Language: | English |
| Number of pages: | 188 |
| Weight: | 589g |
| Height: | 240mm |
| Width: | 185mm |
| Spine width: | 12mm |
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