Advanced Trace Analysis

Advanced Trace Analysis

Hardback (01 Oct 2009)

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Publisher's Synopsis

Discusses statistical approaches to verify trace element analysis data, trace analysis techniques like ICPMS and XRF, ion beam analysis techniques, speciation analysis of uranium relevant to waste disposal and management along with the use of greener techniques for trace elemental speciation analysis.

Book information

ISBN: 9781842655917
Publisher: Alpha Science International Ltd
Imprint: Alpha Science International Ltd
Pub date:
Language: English
Number of pages: 188
Weight: 554g
Height: 248mm
Width: 195mm
Spine width: 16mm