Book (31 Oct 2006)
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Features invaluable input from industry-leading companies and highly-regarded experts in the field. This resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices.
| ISBN: | 9781580537094 |
| Publisher: | Artech House |
| Imprint: | Artech House |
| Pub date: | 31 Oct 2006 |
| DEWEY: | 621.3815 |
| DEWEY edition: | 22 |
| Number of pages: | 301 |
| Weight: | 576g |
| Height: | 236mm |
| Width: | 158mm |
| Spine width: | 23mm |
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