Thermal Reliability of Power Semiconductor Device in the Renewable Energy System

Thermal Reliability of Power Semiconductor Device in the Renewable Energy System - CPSS Power Electronics Series

Hardback (09 Jul 2022)

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Publisher's Synopsis

This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. 

Book information

ISBN: 9789811931314
Publisher: Springer Nature Singapore
Imprint: Springer
Pub date:
DEWEY: 621.38152
DEWEY edition: 23
Language: English
Number of pages: 220
Weight: 408g
Height: 235mm
Width: 155mm
Spine width: 16mm