Hardback (30 Dec 2002)
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Includes the binomial tests of comparison and information on Accept-Reject Tests, the Sequential Probability Ratio Test, Bayesian MTBF and Reliability Demonstration Tests, as well as other important accelerated tests such as Arrhenius, Eyriing, Bazovsky, and Inverse Power Law.
| ISBN: | 9781932078039 |
| Publisher: | DEStech Publications, Inc. |
| Imprint: | DEStech Publications |
| Pub date: | 30 Dec 2002 |
| Language: | English |
| Number of pages: | 877 |
| Weight: | -1g |
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