Publisher's Synopsis
The destructive physical analysis (DPA) of electrochemical devices is an important part of the overall test. Specific tests were developed to investigate the degradation mode or the failure mechanism that surfaces during the course of a cell being assembled, acceptance tested, and life-cycle tested. The tests that have been developed are peculiar to the cell chemistry under investigation. Tests are often developed by an individual or group of researchers as a result of their particular interest in an unresolved failure mechanism or degradation mode. A series of production, operational, and storage issues that were addressed by the Electrochemistry Group at The Aerospace Corporation are addressed. As a result of these investigations, as well as associated research studies carried out to develop a clearer understanding of the nickel oxyhydroxide electrode, a series of unique and useful specialized tests were developed. Some of these special tests were assembled to describe the methods that were found to be particularly useful in resolving a wide spectrum of manufacturing, operational, and storage issues related to nickel-hydrogen cells. The general methodology of these tests is given here with references listed to provide the reader with a more detailed understanding of the tests. The tests are classified according to the sequencing, starting with the impregnation of the nickel plaque material and culminating with the storage of completed cells. The details of the wet chemical procedures that were found to be useful because of their accuracy and reproducibility are given. The equations used to make the appropriate calculations are listed. Zimmerman, A. H. and Quinzio, M. V. and Thaller, L. H. Unspecified Center F04701-88-C-0089...
