Publisher's Synopsis
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
ISTFA 2014 Conference Proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Convention Center, Houston, Texas, USA
Paperback (30 Apr 2015)
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Book information
| ISBN: | 9781627080743 |
| Publisher: | ASM International |
| Imprint: | ASM International |
| Pub date: | 30 Apr 2015 |
| DEWEY: | 621.381 |
| DEWEY edition: | 23 |
| Language: | English |
| Number of pages: | xx, 540 |
| Weight: | -1g |
| Height: | 229mm |
| Width: | 152mm |
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