Paperback (30 Nov 2011)
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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
| ISBN: | 9781615038268 |
| Publisher: | ASM International |
| Imprint: | ASM International |
| Pub date: | 30 Nov 2011 |
| Language: | English |
| Number of pages: | 456 |
| Weight: | -1g |
| Height: | 279mm |
| Width: | 216mm |
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