Recent Developments in Traceable Dimensional Measurements II

Recent Developments in Traceable Dimensional Measurements II 4-6 August, 2003, San Diego, California, USA - SPIE Proceedings Series

Paperback (31 Oct 2003)

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Book information

ISBN: 9780819450630
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 681.25
DEWEY edition: 22
Language: English
Number of pages: 478
Weight: -1g