Detectors for Crystallography and Diffraction Studies at Synchrotron Sources

Detectors for Crystallography and Diffraction Studies at Synchrotron Sources 19 July 1999, Denver, Colorado - SPIE Proceedings Series

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Book information

ISBN: 9780819432605
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 548.83
DEWEY edition: 21
Language: English
Number of pages: 130
Weight: 340g
Height: 279mm
Width: 216mm
Spine width: 12mm