Recent Developments in Optical Gauge Block Metrology

Recent Developments in Optical Gauge Block Metrology 20-21 July 1998, San Diego, California - SPIE Proceedings Series

Paperback (31 May 1999)

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Publisher's Synopsis

This text brings together 34 papers presented at SPIE's 1998 annual meeting. They cover lasers, refractometry and instruments.

Book information

ISBN: 9780819429322
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 681.25
DEWEY edition: 21
Language: English
Number of pages: 308
Weight: 748g
Height: 230mm
Width: 209mm
Spine width: 19mm