Residual Stresses. A Review of Their Measurement and Interpretation Using X-Ray Diffraction - Reports S.
Paperback (31 Dec 1989)
Not available for sale
Includes delivery to the United States
Out of stock
Check stock
Book information
ISBN: | 9780705815222 |
Publisher: | AEA Technology |
Imprint: | AEA Technology |
Pub date: | 31 Dec 1989 |
Language: | English |
Number of pages: | 33 |
Weight: | -1g |
Height: | 300mm |