2007 International Symposium on VLSI Design, Automation & Test (VLSI-DAT)

2007 International Symposium on VLSI Design, Automation & Test (VLSI-DAT) April 25-27, 2007, Hsinchu, Taiwan

Paperback (01 Jan 2007)

Not available for sale

Includes delivery to the United States

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Book information

ISBN: 9781424405824
Publisher: ITRI
Imprint: ITRI
Pub date:
DEWEY: 621.395
DEWEY edition: 22
Language: English
Weight: -1g