2006 IEEE International Integrated Reliability Workshop Final Report

2006 IEEE International Integrated Reliability Workshop Final Report Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006

Paperback (01 Jan 2006)

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Book information

ISBN: 9781424402960
Publisher: Electron Devices Society
Imprint: Electron Devices Society
Pub date:
DEWEY: 621.3815
DEWEY edition: 22
Language: English
Number of pages: 230
Weight: -1g