Paperback (31 May 2001)
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Based on a reliability physics symposium, this CD-ROM covers topics including: device and process; device dielectrics; assembly and packaging; channel hot carriers; interconnects; ESD and latch-up; process induced damage; failure analysis; reliability; and optoelectronic emitters and detectors.
| ISBN: | 9780780365872 |
| Publisher: | I.E.E.E.Press |
| Imprint: | I.E.E.E.Press |
| Pub date: | 31 May 2001 |
| Language: | English |
| Number of pages: | 474 |
| Weight: | 907g |
| Height: | 273mm |
| Width: | 203mm |
| Spine width: | 19mm |
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