2001 IEEE International Conference on Microelectronic Test Structures

2001 IEEE International Conference on Microelectronic Test Structures

Paperback (31 May 2001)

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Publisher's Synopsis

The conference on which this text is based is devoted to the development, measurement and analysis of test structures, providing a forum for designers and users of test structures to discuss recent developments and future directions.

Book information

ISBN: 9780780365117
Publisher: I.E.E.E.Press
Imprint: I.E.E.E.Press
Pub date:
Language: English
Number of pages: 250
Weight: -1g
Height: 279mm
Width: 216mm
Spine width: 19mm