Hardback (31 Oct 1999)
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This volume presents results and developments in all phases of GaAs reliability of control applications. Topics include: qualification methodologies; reliability testing and failure mechanisms; and measurement techniques and device simulation.
| ISBN: | 9780790800653 |
| Publisher: | IEEE |
| Imprint: | IEEE |
| Pub date: | 31 Oct 1999 |
| DEWEY: | 621.38152 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 105 |
| Weight: | -1g |
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