1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto

1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto

Hardback (31 Oct 1997)

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Publisher's Synopsis

This workshop is a forum for discussion of issues in the generation and utilization of statistically significant measurements to characterize and VLSI validate processes, designs and equipment operations. Topics include: metadata; object-orientated techniques; and multidimensional data.

Book information

ISBN: 9780780337374
Publisher: Institute of Electrical and Electronics Engineers
Imprint: Institute of Electrical and Electronics Engineers
Pub date:
Language: English
Number of pages: 124
Weight: -1g
Height: 279mm
Width: 216mm