1994 International Integrated Reliability Workshop Final Report Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994
Hardback (31 Dec 1995)
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Includes delivery to the United States
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Book information
| ISBN: | 9780780319080 |
| Publisher: | IEEE Electron Devices Society |
| Imprint: | IEEE Electron Devices Society |
| Pub date: | 31 Dec 1995 |
| DEWEY: | 621.38152 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 155 |
| Weight: | -1g |
| Height: | 285mm |
| Width: | 222mm |
| Spine width: | 12mm |
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