Paperback (30 Sep 2003)
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Papers from a November 2003 symposium present the latest ideas in the field of testing, in areas including design for testability, enhanced delay testing and ATPG, test power, software testing, fault diagnosis, memory testing, SOC test, DFT synthesis, test scheduling, measurement, test economics, current test, test compaction, functional testing an
| ISBN: | 9780769519517 |
| Publisher: | I.E.E.E.Press |
| Imprint: | I.E.E.E.Press |
| Pub date: | 30 Sep 2003 |
| Language: | English |
| Number of pages: | 500 |
| Weight: | -1g |
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