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The Certification of 100 MM Diameter Silicon Resistivity Srms 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition

The Certification of 100 MM Diameter Silicon Resistivity Srms 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition

Paperback (21 Jan 2014)

  • $19.33
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    Publisher's Synopsis

    This Special Publication summarizes the certification procedure for a new generation of silicon resistivity Standard Reference Materials 2541 through 2547.

    Book information

    ISBN: 9781494743581
    Publisher: On Demand Publishing, LLC-Create Space
    Imprint: Createspace Independent Publishing Platform
    Pub date:
    Language: English
    Number of pages: 134
    Weight: 326g
    Height: 279mm
    Width: 216mm
    Spine width: 7mm

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