Scanning Electron Microscopy and X-Ray Microanalysis

Scanning Electron Microscopy and X-Ray Microanalysis

Fourth edition

eBook (17 Nov 2017)

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Synopsis

Book information

ISBN: 9781493966769
Publisher: Springer
Imprint: Springer New York
Pub date:
Edition: Fourth edition
DEWEY: 502.825
DEWEY edition: 23
Number of pages: 1 online resource (xxiii, 550 )
Weight: -1g